Characterization of Trap States in AlGaN/GaN MIS-High-Electron-Mobility Transistors under Semi-on-State Stress
Ye Liang(Second Affiliated Hospital of Guangzhou Medical University), Wen Liu(Xi’an Jiaotong-Liverpool University), Jie Zhang(Fudan University), Kain Lu Low(University of Liverpool), Jia-Chen Duan(Xi’an Jiaotong-Liverpool University), Ping Zhang(University of Liverpool)
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