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Harmonic analysis and improvement of a new solid-state fault current limiterM.M.R. Ahmed, Lejun Xiao, Ghanim Putrus et al.|IEEE Transactions on Industry Applications|2004Cited by 42
Monitoring Initial Solder Layer Degradation in a Multichip IGBT Module via Combined TSEPsJianxiong Yang, Muzixiang Xiao, Yanbo Che et al.|IEEE Transactions on Device and Materials Reliability|2021Cited by 30
Evaluation of Frequency and Temperature Dependence of Power Losses Difference in Parallel IGBTsJianxiong Yang, Huaping Jiang, Yanbo Che et al.|IEEE Access|2020Cited by 23
Power quality improvement using a solid-state fault current limiterM.M.R. Ahmed, Li Ran, Ghanim Putrus|IEEE PES Transmission and Distribution Conference and Exhibition|2002Cited by 17