TTA-COPE: Test-Time Adaptation for Category-Level Object Pose Estimation
Taeyeop Lee(Korea Advanced Institute of Science and Technology), Kuk‐Jin Yoon(Korea Advanced Institute of Science and Technology), Jonathan Tremblay, Stan Birchfield(Stanford University), Bowen Wen(Nvidia (United States)), Inkyu Shin(Korea Advanced Institute of Science and Technology), Byeong-Uk Lee(Korea Advanced Institute of Science and Technology), Valts Blukis, In So Kweon(Korea Advanced Institute of Science and Technology)
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