Analysis of Transferred MoS<sub>2</sub> Layers Grown by MOCVD: Evidence of Mo Vacancy Related Defect Formation
Ben Schoenaers(KU Leuven), V. V. Afanas’ev(IMEC), Cedric Huyghebaert(IMEC), Inge Asselberghs(IMEC), Ankit Nalin Mehta(IMEC), Michel Houssa(IMEC), A. Stesmans(KU Leuven), Iuliana Radu(IMEC), Stefan De Gendt(Imec the Netherlands), Alessandra Leonhardt(ASM International (Finland)), Daniele Chiappe(IMEC)
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