Direct Probing of the Dielectric Scavenging-Layer Interface in Oxide Filamentary-Based Valence Change Memory
Umberto Celano(Arizona State University), Wilfried Vandervorst(IMEC), P. M. Koenraad(Eindhoven University of Technology), Jonathan Op de Beeck(IMEC), Ludovic Goux(IMEC), Sergiu Clima(IMEC), Michael Luebben(Jülich Aachen Research Alliance), Ilia Valov(Forschungszentrum Jülich)
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