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Three-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory DevicesUmberto Celano, Wilfried Vandervorst, Olivier Richard et al.|Nano Letters|2014Cited by 338
Imaging the Three-Dimensional Conductive Channel in Filamentary-Based Oxide Resistive Switching MemoryUmberto Celano, Wilfried Vandervorst, Olivier Richard et al.|Nano Letters|2015Cited by 181
Understanding the Dual Nature of the Filament Dissolution in Conductive Bridging DevicesUmberto Celano, Wilfried Vandervorst, M. Jurczak et al.|The Journal of Physical Chemistry Letters|2015Cited by 71
Direct Probing of the Dielectric Scavenging-Layer Interface in Oxide Filamentary-Based Valence Change MemoryUmberto Celano, Wilfried Vandervorst, Sergiu Clima et al.|ACS Applied Materials & Interfaces|2017Cited by 55