Three-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory DevicesUmberto Celano, Wilfried Vandervorst, Christophe Detavernier et al.|Nano Letters|2014Cited by 338
Understanding the Dual Nature of the Filament Dissolution in Conductive Bridging DevicesUmberto Celano, Wilfried Vandervorst, Ludovic Goux et al.|The Journal of Physical Chemistry Letters|2015Cited by 71
Switching mechanism and reverse engineering of low-power Cu-based resistive switching devicesUmberto Celano, Wilfried Vandervorst, M. Jurczak et al.|Nanoscale|2013Cited by 35