Electromigration effect of Ni electrodes on the resistive switching characteristics of NiO thin films
C. B. Lee(Samsung (South Korea)), Bae Ho Park(Konkuk University), Jae Hur(Samsung (South Korea)), Jaehan Park(Samsung (South Korea)), Seung‐Eon Ahn(Samsung (South Korea)), K. H. Kim(Samsung (South Korea)), Huaxiang Yin(Chinese Academy of Sciences), Myoung‐Jae Lee(Samsung (South Korea)), In Kyeong Yoo(Samsung (South Korea)), B. S. Kang(Samsung (South Korea)), Yeonsang Park(Samsung (South Korea)), W. X. Xianyu(Samsung (South Korea)), Г. Б. Стефанович(Samsung (South Korea))
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