Measurement method of aberration from Ronchigram by autocorrelation function

Hidetaka Sawada(JEOL (Japan)), Kan Takayanagi(Tokyo Institute of Technology), Takumi Sannomiya(JEOL (Japan)), Y. Tanishiro(Tokyo Institute of Technology), Yukihito Kondo(JEOL (Japan)), T. Tomita(Japan Science and Technology Agency), T. Nakamichi(JEOL (Japan)), T. Kaneyama(JEOL (Japan)), Takayuki Tanaka(Shanghai Shipbuilding Technology Research Institute), F. Hosokawa(Japan Science and Technology Agency), Yoshifumi Oshima(Tokyo Institute of Technology)
Ultramicroscopy
June 20, 2008
Cited by 87


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