Measurement method of aberration from Ronchigram by autocorrelation functionHidetaka Sawada, Kan Takayanagi, Takayuki Tanaka et al.|Ultramicroscopy|2008Cited by 87
Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration CorrectorHidetaka Sawada, Kunio Takayanagi, Naoki Yamamoto et al.|Japanese Journal of Applied Physics|2007Cited by 64