Differential phase-contrast microscopy at atomic resolutionNaoya Shibata, Yuichi Ikuhara, Hidetaka Sawada et al.|Nature Physics|2012Cited by 465
Robust atomic resolution imaging of light elements using scanning transmission electron microscopyScott D. Findlay, Yuichi Ikuhara, Hidetaka Sawada et al.|Applied Physics Letters|2009Cited by 377
Measurement method of aberration from Ronchigram by autocorrelation functionHidetaka Sawada, Kan Takayanagi, Takumi Sannomiya et al.|Ultramicroscopy|2008Cited by 87
Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration CorrectorHidetaka Sawada, Kunio Takayanagi, Naoki Yamamoto et al.|Japanese Journal of Applied Physics|2007Cited by 64