Robust atomic resolution imaging of light elements using scanning transmission electron microscopy
Scott D. Findlay(Monash University), Yuichi Ikuhara(Institute of Engineering), Takahisa Yamamoto(Nagoya University), Eiji Okunishi(JEOL (Japan)), Hidetaka Sawada(JEOL (Japan)), Yukihito Kondo(JEOL (Japan)), N. Shibata(JEOL (Japan))
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