Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration Corrector
Hidetaka Sawada(JEOL (Japan)), Kunio Takayanagi(Tokyo Institute of Technology), Yoshifumi Oshima(Tokyo Institute of Technology), Takumi Sannomiya(JEOL (Japan)), Naoki Yamamoto(Tokyo Institute of Technology), Y. Tanishiro(Tokyo Institute of Technology), Yukihito Kondo(JEOL (Japan)), M Kawazoe(JEOL (Japan)), Takeshi Tomita(JEOL (Japan)), T. Kaneyama(JEOL (Japan)), Fumio Hosokawa(JEOL (Japan)), Takayuki Tanaka(Shanghai Shipbuilding Technology Research Institute), M Terao(JEOL (Japan)), Toshihiro Ishizawa(JEOL (Japan))
Cited by 64
Related Papers
Conjugated porphyrin arrays: synthesis, properties and applications for functional materials
|Chemical Society Reviews|2014|692
Chemistry of<i>meso</i>-Aryl-Substituted Expanded Porphyrins: Aromaticity and Molecular Twist
|Chemical Reviews|2016|469
Differential phase-contrast microscopy at atomic resolution
|Nature Physics|2012|465
Dynamics of annular bright field imaging in scanning transmission electron microscopy
|Ultramicroscopy|2010|447
Robust atomic resolution imaging of light elements using scanning transmission electron microscopy
|Applied Physics Letters|2009|377