Electrical Properties of III-V/Oxide Interfaces
Guy Brammertz(IMEC), Marc Heyns(IMEC), Annelies Delabie(IMEC), David Kohen, Sonja Sioncke(IMEC), Matty Caymax(IMEC), J. Penaud(Fraunhofer Institute for Nondestructive Testing), Marc Meuris(IMEC), Wei Wang(Chinese Academy of Tropical Agricultural Sciences), H. C. Lin(IMEC), Clément Merckling(IMEC), Ali-Reza Alian, Koen Martens(IMEC)
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