Characteristic trapping lifetime and capacitance-voltage measurements of GaAs metal-oxide-semiconductor structures
Guy Brammertz(IMEC), Marc Heyns(IMEC), Annelies Delabie(IMEC), Sonja Sioncke(IMEC), Koen Martens(IMEC), Matty Caymax(IMEC), Marc Meuris(IMEC)
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