A self-testing multiplexed CMOS stimulating probe for a 1024-site neural prosthesis
Yifan Yao(Nankai University), K.D. Wise(University of Michigan), M.N. Gulari(University of Michigan), J.F. Hetke(University of Michigan)
Cited by 17
Related Papers
TDI charge-coupled devices: Design and applications
|IBM Journal of Research and Development|1992|91
Electromigration in three-dimensional integrated circuits
|Applied Physics Reviews|2023|67
Thermally Resistant, Mechanically Robust, Enamel‐Inspired Hydroxyapatite/Polyethylene Nanocomposite Battery Separator
|Advanced Functional Materials|2023|41
Coupling effect between electromigration and joule heating on the failure of ball grid array in 3D integrated circuit technology
|Journal of Materials Research and Technology|2023|31