Temperature dependence of frequency dispersion in III–V metal-oxide-semiconductor C-V and the capture/emission process of border traps
Abhitosh Vais(IMEC), Aaron Thean(National University of Singapore), Michael Givens(ASM International (Belgium)), Fu Tang(ASM International), Qi Xie(ASM International (Belgium)), Nadine Collaert(IMEC), Chunmeng Dou(Chinese Academy of Sciences), Kristin DeMeyer(IMEC), Jean‐Pierre Raskin(UCLouvain), H. C. Lin(IMEC), Jan Willem Maes(ASM International (Belgium)), Tsvetan Ivanov(IMEC), Koen Martens(IMEC)
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