Analysing semiconductor manufacturing big data for root cause detection of excursion for yield enhancementChen–Fu Chien, Shih‐Chung Chuang, Chiao-Wen Liu|International Journal of Production Research|2015Cited by 89
A Framework for Root Cause Detection of Sub-Batch Processing System for Semiconductor Manufacturing Big Data AnalyticsChen–Fu Chien, Shih‐Chung Chuang|IEEE Transactions on Semiconductor Manufacturing|2014Cited by 77
A framework for nonparametric profile monitoringShih‐Chung Chuang, Su‐Fen Yang, Ying‐Chao Hung et al.|Computers & Industrial Engineering|2012Cited by 36
Nonparametric profile monitoring in multi-dimensional data spacesYing‐Chao Hung, Yi‐Kuan Tseng, Wen-Chi Tsai et al.|Journal of Process Control|2012Cited by 24
Estimation and monitoring of traffic intensities with application to control of stochastic systemsYing‐Chao Hung, Shih‐Chung Chuang, George Michailidis|Applied Stochastic Models in Business and Industry|2012Cited by 6