Advancing CMOS beyond the Si roadmap with Ge and III/V devicesMarc Heyns, Liesbeth Witters, Brice De Jaeger et al.|Unknown|2011Cited by 60
Contrast reversal in scanning capacitance microscopy imagingR. J. Stephenson, Wilfried Vandervorst, Anne S. Verhulst et al.|Applied Physics Letters|1998Cited by 54
Nonmonotonic behavior of the scanning capacitance microscope for large dynamic range samplesR. J. Stephenson, Wilfried Vandervorst, Anne S. Verhulst et al.|Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena|2000Cited by 26