William E. Vanderlinde

Physical Sciences (United States)

Publishes on Electron and X-Ray Spectroscopy Techniques, Integrated Circuits and Semiconductor Failure Analysis, Advanced Electron Microscopy Techniques and Applications. 35 papers and 210 citations.

PubIndex Score3Top 97% · seniorHow it's scored

35Publications

210Total Citations

First publication: 1962First senior author: 1985

Electron and X-Ray Spectroscopy Techniques Integrated Circuits and Semiconductor Failure Analysis Advanced Electron Microscopy Techniques and Applications Ion-surface interactions and analysis Metal and Thin Film Mechanics

Top publicationsby citations

Scanning SQUID microscopy for current imaging

L.A. Knauss, William E. Vanderlinde, N. Lettsome et al.|Microelectronics Reliability|2001

Cited by 49

Reactive ion beam etching of polyimide thin films

William E. Vanderlinde, Arthur L. Ruoff|Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena|1988

Cited by 33

Thermal stability of SrTiO3/SiO2/Si Interfaces at Intermediate Oxygen Pressures

Grace Yong, S. Friedrich, Kunitaka Muramatsu et al.|Journal of Applied Physics|2010

Cited by 18

Blind Deconvolution of SEM Images

William E. Vanderlinde, James N. Caron|Proceedings - International Symposium for Testing and Failure Analysis|2007

Cited by 12

Polymer diffusion as a probe of damage in ion or plasma etching

S. F. Tead, Frank D. Egitto, A. L. Ruoff et al.|Journal of Applied Physics|1990

Cited by 11