Failure analysis of integrated devices by scanning thermal microscopy (SThM)G.B.M. Fiege, L.J. Balk, M. Maywald et al.|Microelectronics Reliability|1998Cited by 50
Imaging of Local Thermal and Electrical Conductivity with Scanning Force MicroscopyM. Maywald, L.J. Balk, Russell J. Pylkki|Digital Commons - USU (Utah State University)|1994Cited by 16
Correlation of the electrical, thermal, and optical properties of CVD diamond films by scanning microscopy techniquesR. Heiderhoff, Peter K. Bachmann, L.J. Balk et al.|Diamond and Related Materials|1995Cited by 15