Correlation of the electrical, thermal, and optical properties of CVD diamond films by scanning microscopy techniques
R. Heiderhoff(University of Wuppertal), Peter K. Bachmann(Philips (Germany)), M. Maywald(Siemens (Germany)), P. Koschinski(Institut für Arbeitsmedizin, Sicherheitstechnik und Ergonomie), L.J. Balk(Leibniz University Hannover)
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