Self-heating assesment of GaN DHFETs using mono-lithically fabricated 2-DEG resistorsPuneet Srivastava, Gustaaf Borghs, J. Das et al.|Unknown|2010Cited by 0
Preliminary reliability assessment of GaN-on-Si HEMT using in-situ Si3N4 cap layerDenis Marcon, Gustaaf Borghs, Farid Medjdoub et al.|Unknown|2008Cited by 0