Preliminary reliability assessment of GaN-on-Si HEMT using in-situ Si3N4 cap layer
Denis Marcon, Gustaaf Borghs(KU Leuven), Anne Lorenz, Maarten Leys(IMEC), Stefan Degroote(IMEC), Kai Cheng(Nanopolis Suzhou (China)), J. Das, Farid Medjdoub, Robert Mertens(Humboldt-Universität zu Berlin), Marianne Germain, Joff Derluyn
Unknown
January 1, 2008
Cited by 0
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