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Alex von Bohlen

Leibniz Institute for Analytical Sciences - ISAS

ORCID: 0000-0002-1572-6176

144 papers and 6.2k citations.

PubIndex Score96Top 4%How it's scored

144Publications

6.2kTotal Citations

First senior author: 1989

Top publicationsby citations

Depth profiles of a shallow implanted layer in a Si wafer determined by different methods of thin-layer analysis

R. Klockenkämper, Alex von Bohlen, Harry Becker et al.|Spectrochimica Acta Part B Atomic Spectroscopy|2002

Cited by 28

Comparison of shallow depth profiles of cobalt-implanted Si wafers determined by total reflection x-ray fluorescence analysis after repeated stratified etching and by rutherford backscattering spectrometry

R. Klockenkämper, L. Palmetshofer, Alex von Bohlen et al.|Surface and Interface Analysis|1999

Cited by 19

Indexing the rest of 144 publications…