Characterization of LiNb1−xTaxO3 composition-spread thin film by the scanning microwave microscopeNoriaki Okazaki, Tetsuya Hasegawa, Tomoteru Fukumura et al.|Applied Surface Science|2003Cited by 7
High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7−δ thin film by the low-temperature scanning microwave microscopeSohei Okazaki, Tetsuya Hasegawa, Noriaki Okazaki et al.|Applied Surface Science|2005Cited by 5
The Development of Scanning Microwave Microscope for High-Throughput Characterization of Dielectric and Conducting Materials at Low TemperaturesSohei Okazaki, Tetsuya Hasegawa, Hideomi Koinuma et al.|MRS Proceedings|2003Cited by 2