High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7−δ thin film by the low-temperature scanning microwave microscope

Sohei Okazaki(Tokyo Institute of Technology), Tetsuya Hasegawa(The University of Tokyo), Toyohiro Chikyow(National Institute for Materials Science), Ryota Takahashi(Tokyo Institute of Technology), Yuji Matsumoto(Tokyo Institute of Technology), Sei-ichiro Yaginuma(Tokyo Institute of Technology), H. Sugaya(Kyoto University), Hideomi Koinuma(Cabinet Office), Xiaoru Zhao(Air Force Engineering University), Noriaki Okazaki(National Institute for Materials Science), Makoto Murakami(Tohoku University)
Applied Surface Science
October 4, 2005
Cited by 5


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