The Development of Scanning Microwave Microscope for High-Throughput Characterization of Dielectric and Conducting Materials at Low Temperatures
Sohei Okazaki(Tokyo Institute of Technology), Tetsuya Hasegawa(Tokyo Institute of Technology), Ken Hasegawa, Toyohiro Chikyow(National Institute for Materials Science), M. Kawasaki(RIKEN Center for Emergent Matter Science), Jun Nishimura(Japan Aerospace Exploration Agency), Tomoteru Fukumura(Japan Science and Technology Agency), H. Sugaya(Kyoto University), Parhat Ahmet(National Institute for Materials Science), Hideomi Koinuma(Cabinet Office), Yuji Mastumoto(Tokyo Institute of Technology), Xiaoru Zhao(Air Force Engineering University), Noriaki Okazaki(National Institute for Materials Science), Makoto Murakami(Tohoku University)
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