Statistical Fluctuations in HfO<sub><italic><bold>x</bold></italic></sub> Resistive-Switching Memory: Part I - Set/Reset VariabilityStefano Ambrogio, Daniele Ielmini, Antonio Cubeta et al.|IEEE Transactions on Electron Devices|2014Cited by 220
Statistical Fluctuations in HfO<sub><i>x</i></sub> Resistive-Switching Memory: Part II—Random Telegraph NoiseStefano Ambrogio, Daniele Ielmini, Antonio Cubeta et al.|IEEE Transactions on Electron Devices|2014Cited by 128