Statistical Fluctuations in HfO<sub><italic><bold>x</bold></italic></sub> Resistive-Switching Memory: Part I - Set/Reset Variability
Stefano Ambrogio(IBM (United States)), Daniele Ielmini(Politecnico di Milano), Antonio Cubeta(Politecnico di Milano), Alessandro Calderoni(Micron (United States)), Simone Balatti, Nirmal Ramaswamy(Micron (United States))
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