Berreman effect applied to phase characterization of thin films supported on metallic substrates: The case of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">TiO</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>B. C. Trasferetti, Mário A. Bica de Moraes, Rita Aparecida Zoppi et al.|Physical review. B, Condensed matter|2001Cited by 37