Cryogen-free scanning gate microscope for the characterization of Si/Si0.7Ge0.3 quantum devices at milli-Kelvin temperaturesSeong W. Oh, J. R. Petta, Pengcheng Chen et al.|AIP Advances|2021Cited by 17
Microwave-frequency scanning gate microscopy of a Si/SiGe double quantum dotArtem O. Denisov, J. R. Petta, Adam Mills et al.|arXiv (Cornell University)|2022Cited by 16
Dispersive readout of a silicon quantum device using an atomic force microscope-based rf gate sensorArtem O. Denisov, J. R. Petta, Gordian Fuchs et al.|Applied Physics Letters|2023Cited by 3
Gating a Quantum Dot through the Sequential Removal of Single Electrons from a Nanoscale Floating GateArtem O. Denisov, J. R. Petta, Gordian Fuchs et al.|PRX Quantum|2023Cited by 2
Toward utilizing scanning gate microscopy as a high-resolution probe of valley splitting in Si/SiGe heterostructuresEfe Cakar, J. R. Petta, Hamdi Ercan et al.|Applied Physics Letters|2024Cited by 1