Toward utilizing scanning gate microscopy as a high-resolution probe of valley splitting in Si/SiGe heterostructures

Efe Cakar(University of California, Los Angeles), J. R. Petta(University of California, Los Angeles), Gordian Fuchs(Princeton University), Hamdi Ercan(University of California, Los Angeles), Christopher R. Anderson(University of California, Los Angeles), Mark F. Gyure(HRL Laboratories (United States)), Artem O. Denisov
Applied Physics Letters
September 30, 2024
10.1063/5.0217704
Cited by 1

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