Cryogen-free scanning gate microscope for the characterization of Si/Si0.7Ge0.3 quantum devices at milli-Kelvin temperatures

Seong W. Oh(Princeton University), J. R. Petta(University of California, Los Angeles), Artem O. Denisov, Pengcheng Chen(Southwest Petroleum University)
AIP Advances
December 1, 2021
Cited by 17


Related Papers