BTI Reliability Enhancement of Ge-Doped In₂O₃ TFTs via Al₂O₃ Passivation
IEEE International Symposium on Reliability Physics 2026, Serges Zambou(ASM International (Finland)), Sizhe Ma(Carnegie Mellon University), Ranjith K. Ramachandran(Ghent University Hospital), Aditya Chauhan(ASM International (Finland)), Yushan Lee(University of Notre Dame), Yiyan Yu(University of Notre Dame), Jiahui Duan(University of Notre Dame), Glen Wilk(Arizona Summit Law School), Xingtian Wang(University of Notre Dame), Yixin Qin(University of Notre Dame), Chris Hinkle(University of Notre Dame), Alessandra Leonhardt(ASM International (Finland))
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