The Influence of Bond Wire Aging on DM EMI Noise in IGBT Converters Considering High-Frequency Ringing

Sai Gao(Northwestern Polytechnical University), Mingxing Du(Tianjin University of Technology), Jianxiong Yang(Tianjin University of Technology)
IEEE Transactions on Device and Materials Reliability
March 7, 2025
Cited by 2


Related Papers