A Dual-Band Micromachined On-Wafer Probe with Integrated Diplexer for Ultra-Broadband Measurements to 220 GHz
Matthew F. Bauwens(University of Virginia), Arthur W. Lichtenberger(University of Virginia), N. Scott Barker(University of Virginia), Robert M. Weikle(Microprobes (United States)), Thomas Zwick(Karlsruhe Institute of Technology), Michael E. Cyberey(University of Virginia), F. Boes(Karlsruhe Institute of Technology)
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