Micromachined Probes for Submillimeter-Wave On-Wafer Measurements—Part II: RF Design and Characterization
Theodore Reck(Virginia Diodes (United States)), N. Scott Barker(University of Virginia), Lihan Chen(University of Virginia), Christopher Groppi, Chunhu Zhang(University of Virginia), Robert M. Weikle(Microprobes (United States)), Alex Arsenovic(University of Virginia), Arthur W. Lichtenberger(University of Virginia)
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