Investigating the Occurrence of Bifurcation in Large Metalized Wafers using ANSYS Layered Shell Elements
Vincenzo Vinciguerra(STMicroelectronics (Switzerland)), Marco Renna(STMicroelectronics (Switzerland)), Antonio Landi(STMicroelectronics (Italy)), Giuseppe Luigi Malgioglio(STMicroelectronics (Italy)), Mohamed Boutaleb(STMicroelectronics (France)), Fabrice Roqueta(STMicroelectronics (France))
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