Low‐Voltage and High Thermal Stability Single‐Element Te Selector with Failed Bit Pruning Operation Enabling Robust Cross‐Point Memory
Yaxin Ding(Beijing Microelectronics Technology Institute), Qing Luo(University of Chinese Academy of Sciences), Junjie An(Chinese Academy of Sciences), Pengfei Jiang(Chinese Academy of Sciences), Lingfei Wang(Fraunhofer Institute for Integrated Circuits), Jingrui Guo(Chinese Academy of Sciences), Jiabin Shen(Fudan University), Chunmeng Dou(Chinese Academy of Sciences), Yuan Wang(University of Macau), Yuting Chen(Qinghai University), Min Zhu(Shandong University of Science and Technology), Shujing Jia(Institute of Molecular Functional Materials), Tiancheng Gong(University of Chinese Academy of Sciences)
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