Low‐Voltage and High Thermal Stability Single‐Element Te Selector with Failed Bit Pruning Operation Enabling Robust Cross‐Point MemoryYaxin Ding, Qing Luo, Jingrui Guo et al.|Advanced Electronic Materials|2022Cited by 7
CCDC 2260014: Experimental Crystal Structure DeterminationGuanghui Lv, Yong Wu, Qingyao Zhang et al.|The Cambridge Structural Database|2023Cited by 0