Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS<sub>2</sub>
Alessandra Leonhardt(ASM International (Finland)), Stefan De Gendt(Imec the Netherlands), Cedric Huyghebaert(IMEC), Takashi Taniguchi(National Institute for Materials Science), Thomas Nuytten(IMEC), Kenji Watanabe(National Institute for Materials Science), César Javier Lockhart de la Rosa(IMEC), Luca Banszerus(University of Vienna), Christoph Stampfer(Forschungszentrum Jülich), Vivek Mootheri(ASM International (Belgium)), Stefanie Sergeant(IMEC)
Cited by 15
Related Papers
One-Dimensional Electrical Contact to a Two-Dimensional Material
|Science|2013|3.1k
Direct observation of the layer-dependent electronic structure in phosphorene
|Nature Nanotechnology|2016|820
Correlated states in twisted double bilayer graphene
|Nature Physics|2020|545