Engineering Wafer-Scale Epitaxial Two-Dimensional Materials through Sapphire Template Screening for Advanced High-Performance NanoelectronicsYuanyuan Shi, Matty Caymax, Benjamin Groven et al.|ACS Nano|2021Cited by 60
Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS<sub>2</sub>Alessandra Leonhardt, Stefan De Gendt, Christoph Stampfer et al.|Advanced Materials Interfaces|2020Cited by 15
Trap Density Assessment on Multilayer WS<sub>2</sub> using Power-Dependent Indirect PhotoluminescenceAlessandra Leonhardt, Stefan De Gendt, Thomas Nuytten et al.|ECS Journal of Solid State Science and Technology|2020Cited by 3
(Invited) Impact of Substrates and Interfaces on 2D TMDC PropertiesAlessandra Leonhardt, Stefan De Gendt, Vivek Mootheri et al.|ECS Meeting Abstracts|2020Cited by 0