Electronic Calibration for Submillimeter-Wave On-Wafer Scattering Parameter Measurements Using Schottky Diodes
Linli Xie(University of Virginia), Robert M. Weikle(Microprobes (United States)), Souheil Nadri(University of Virginia), N. Scott Barker(University of Virginia), Arthur W. Lichtenberger(University of Virginia), Matthew F. Bauwens(University of Virginia), Alexander Arsenovic(University of Virginia), Michael E. Cyberey(University of Virginia)
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