Ultralow Power Resistance Random Access Memory Device and Oxygen Accumulation Mechanism in an Indium–Tin-Oxide Electrode

Chih-Hung Pan(National Sun Yat-sen University), Simon M. Sze(National Yang Ming Chiao Tung University), Ting‐Chang Chang(National Sun Yat-sen University), Tsung‐Ming Tsai(National Sun Yat-sen University), Kuan‐Chang Chang(National Taipei University of Technology), Chih‐Yang Lin(National Sun Yat-sen University), Chih‐Cheng Shih(National Sun Yat-sen University), He Qian(University of Science and Technology of China), Tian-Jian Chu(National Sun Yat-sen University), Huaqiang Wu(Institute of Microelectronics), Po‐Hsun Chen(National Sun Yat-sen University), Ning Deng(Fujitsu (China))
IEEE Transactions on Electron Devices
October 24, 2016
Cited by 18


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