Cryogenic temperature, 2-port, on-wafer characterization at WR-5.1 frequencies
David R. Daughton(Lake Shore Cryotronics (United States)), Scott Yano(Lake Shore Cryotronics (United States)), N. Scott Barker(University of Virginia), Arthur W. Lichtenberger(University of Virginia), Matthew F. Bauwens(University of Virginia), Jeremy Bluestein(Lake Shore Cryotronics (United States)), Jeffrey L. Hesler(Virginia Diodes (United States)), Doug McLean(Lake Shore Cryotronics (United States)), Eric Bryerton, Cliff Rowland(Virginia Diodes (United States)), Michael E. Cyberey(University of Virginia), E. de Rijk(École Polytechnique Fédérale de Lausanne), Mirko Favre, Robert M. Weikle(Microprobes (United States))
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