Fast imaging measurements and modeling of neutral and impurity density on C-2U

E. Granstedt(TAE Technologies, Inc (United States)), K. Zhai(TAE Technologies, Inc (United States)), Sean Dettrick(TAE Technologies, Inc (United States)), T. Roche(TAE Technologies, Inc (United States)), Boyu Deng, D. Osin(Tokamak Energy (United Kingdom)), D. Gupta(TAE Technologies, Inc (United States))
Bulletin of the American Physical Society
October 31, 2016
Cited by 0

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