Roughness Characterization by Optical Spectroscopy of CoSi<sub>2</sub> Thin Films
S. Bocelli(University of Pavia), C. S. Petersson(KTH Royal Institute of Technology), F. Marabelli(University of Pavia), G. Guizzetti(University of Pavia), S. Hatziconstantinidou(KTH Royal Institute of Technology)
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