Electrical and optical properties of silicide single crystals and thin films
F. Nava(IBM Research - Thomas J. Watson Research Center), O. Bisi, G. Guizzetti(University of Pavia), U. Gottlieb(Centre National de la Recherche Scientifique), O. Laborde(Centre National de la Recherche Scientifique), A. Borghesi(Inserm), J.P. Sénateur(Centre National de la Recherche Scientifique), R. Madar(Centre National de la Recherche Scientifique), K. N. Tu(City University of Hong Kong), Ο. Thomas(IBM (United States))
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