WR-5.1 band, on-wafer characterization at cryogenic temperatures
David R. Daughton(Lake Shore Cryotronics (United States)), Eric Bryerton, N. Scott Barker(University of Virginia), A. Macor, Arthur W. Lichtenberger(University of Virginia), Matthew F. Bauwens(University of Virginia), Arndt von Bieren, Jeffrey L. Hesler(Virginia Diodes (United States)), Doug McLean(Lake Shore Cryotronics (United States)), Cliff Rowland(Virginia Diodes (United States)), E. de Rijk(École Polytechnique Fédérale de Lausanne), Scott Yano(Lake Shore Cryotronics (United States)), Mirko Favre, Robert M. Weikle(Microprobes (United States))
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